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Tecnatom Presents Phased Array Technology for Inspection

16 June 2015

Tecnatom will show its first commercial system using phased array technology for through-transmission ultrasonics inspection (PA TTU), that is said to notably reduces the scanning time of components at the Paris Airshow, 15-21 June 2015, in Paris, France.

Tecnatom says the event represents a great opportunity to show the latest advancesin the development and delivery of NDT systems including inspection cells integrated in the manufacturing process to ensure quality and NDT equipment development for manual or automated inspection in maintenance activities. 

Maria Teresa Aguado, Deputy Director of Technology and Product Development at Tecnatom said, "we are very proud of participating once more in the most important international aerospace show, and this is the eighth edition we do. This event brings together not only companies from the host country, with a significant weight in the European aviation industry, but also many others international OEMs and Tier Ones. There is no doubt, this international event Paris Air Show-Le Bourget is a must for Tecnatom, where we pretend to show our capacities to be the best technological partner."






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